Analysis of Failure of Electronic Circuits from EMP-Induced Signals: Review and Contribution,

Abstract

The elements (circuit models, condition for damage, or damage thresholds, of semiconductor components, circuit analysis codes) of a method (circuit-failure analysis) for determining damage in an electronic system from a signal induced by an electromagnetic pulse (EMP) are discussed. The state of the art in the areas of circuit models, damage thresholds, etc., is compared with the information and capability required for circuit-failure analysis. Results of research into second breakdown are discussed to the extent they relate to the condition for damage of junction components from electrical transients. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1973
Accession Number
AD0778754

Entities

People

  • Bruno Kalab

Organizations

  • Harry Diamond Laboratories

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Circuit Analysis
  • Circuits
  • Compound Semiconductors
  • Electromagnetic Pulses
  • Electronic Circuits
  • Electronics
  • Failure Analysis
  • Semiconductors
  • Solid State Electronics

Fields of Study

  • Engineering

Readers

  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Semiconductor Device Technology
  • Systems Analysis and Design

Technology Areas

  • Microelectronics