A Technique for Measuring the Thickness of a Thin Contaminant Layer

Abstract

A method of determining the thickness of a known contaminant on a 77K metallic reflecting surface is considered. A single reflectance measurement is used to determine the thickness after the optical constants of the contaminant and the reflecting surface have been determined. An existing research chamber is modified for experimental evaluation of this approach to a thickness measurement, and an experimental program is outlined. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1974
Accession Number
AD0778842

Entities

People

  • W. G. Kirby

Organizations

  • Arnold Engineering Development Complex

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Classification
  • Engineering
  • Environmental Pollutants
  • Flow
  • Gas Flow
  • Government Procurement
  • Governments
  • Infrared Equipment
  • Mirrors
  • Optical Equipment
  • Optical Properties
  • Optics
  • Security
  • Tennessee
  • Thickness
  • United States

Readers

  • Spectroscopy.
  • Surface Engineering/Surface Coating Technology.