Pulse Power Studies of Hardened Microcircuits.

Abstract

A study was made of the effects of large amplitude transient pulses on radiation tolerant integrated circuits. Two distinct burnout mechanisms exist, diode failure and resistor burnout. Both mechanisms were investigated independently by test structures to measure the influence of processing variations on the failure levels. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1973
Accession Number
AD0779666

Entities

People

  • D. M. Smith
  • W. F. Kennan

Organizations

  • Texas Instruments

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Amplitude
  • Circuits
  • Electronic Equipment
  • Electronics
  • Integrated Circuits
  • Microcircuits
  • Networks
  • Radiation
  • Resistors

Fields of Study

  • Engineering
  • Physics

Readers

  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Space Exploration and Orbital Mechanics.
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics