Magnetization Switching in a Magneto-Optic Thin Film
Abstract
An improved technique for observing sub-nanosecond magnetization changes in thin films has been used to study the underdamped oscillatory behavior in a (Y(2.5)Gd(.5))Fe4Ga1)O12 sample. The measurement set-up uses a version of the alternate sampling technique in which the sensitivity has been upgraded by the use of a lock-in amplifier. By using a shorted strip-line of appropriate length to apply to the film two properly timed magnetic field steps, the precession of the magnetization can be quelled, and the magnetization can be switched between initial and final directions in a half-cycle of the resonant frequency.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1974
- Accession Number
- AD0780703
Entities
People
- James M. White
- S. C. Tseng
Organizations
- IBM Thomas J. Watson Research Center