Failure Mechanisms in Irradiated Plastic Integrated Circuits.

Abstract

The program was devised to evaluate the performance of plastic integrated circuits in various types of radiation environments. Two different test parts were employed. These parts were selected to be representative of broad semiconductor processing technologies. The bipolar process technology was represented by 741 operational amplifier. The complementary metal-oxide-silicon (CMOS) process was represented by the 4028 binary-to-decimal decoder. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1974
Accession Number
AD0780912

Entities

People

  • Sheldon A. Taylor

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Amplifiers
  • Chemical Compounds
  • Circuits
  • Complementary Metal-Oxide Semiconductors
  • Compound Semiconductors
  • Electronics
  • Environment
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Metal Oxide Semiconductors
  • Metal Oxides
  • Operational Amplifiers
  • Oxides
  • Radiation
  • Semiconductors

Readers

  • Computer Programming and Software Development.
  • Electronics Engineering
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics