Investigation of the Physical Origins of Noise in Avalanche and Gunn Oscillators and Noise Reduction Techniques.
Abstract
The noise generated by Gunn diode microwave oscillators was studied to determine the physical causes of noise, the relation between low frequency and microwave noise, and to develop an equivalent circuit for the diode. The use of a cavity to reduce FM noise was investigated. Methods for optimizing the performance of IMPATT diode oscillators, including noise performance, were studied. Portions of this document are not fully legible.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 08, 1974
- Accession Number
- AD0780935
Entities
People
- Daniel Leenov
- John G. Ondria
Organizations
- Lehigh University