Transient Temperature Rise in Film Resistors
Abstract
Transient temperature distributions in film resistors are calculated for time intervals ranging from 10 nsec to 100 microsec. A one-dimensional model consisting of substrate, resistive film, and jacket is assumed. Peak temperatures are plotted for various film thicknesses, using thermal properties appropriate for resistors from four manufacturers.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1974
- Accession Number
- AD0781125
Entities
People
- Henry Domingos
Organizations
- Clarkson University