A Device for Measuring Thermoelectric and Thermomagnetic Efficiency of Semiconductors,

Abstract

The authors have designed a device for direct measurement of thermoelectric and thermomagnetic efficiency based on Harman's method and Harman's modified methods respectively, on which preliminary measurements were made. Research in a temperature range of 100-400K are possible.

Document Details

Document Type
Technical Report
Publication Date
May 03, 1974
Accession Number
AD0781247

Entities

People

  • B. G. Tikhomirov
  • S. A. Supostat

Organizations

  • United States Army Foreign Science and Technology Center

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Efficiency
  • Electronics
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Measurement
  • Semiconductors
  • Solid State Electronics

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Rehabilitation and Prosthetic Care for Military Service Members and Veterans with Limb Loss or Disability.

Technology Areas

  • Microelectronics