Deposition Profiles by Vaporization Expansion Wave Method.

Abstract

A scheme is presented for measurement of deposition profiles in electrically conducting materials, effective in an energy range in which the material is in the mixed liquid-vapor state. An oscillographic record of sensor resistance may be made to yield a plot of deposited energy as a function of depth in the sensor by use of a slow, vaporization-expansion wave model. The results of tests in copper and aluminum sensors are shown and steps to improve accuracy are discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1974
Accession Number
AD0781494

Entities

People

  • Henry S. Burden

Organizations

  • Ballistic Research Laboratory

Tags

Communities of Interest

  • Sensors

DTIC Thesaurus Topics

  • Accuracy
  • Aluminum
  • Fluids
  • Materials
  • Measurement
  • Resistance
  • Vaporization
  • Vapors

Fields of Study

  • Physics

Readers

  • Coastal Oceanography
  • Combustion and Flow Dynamics.
  • Electrochemical Engineering/ Fuel Cell Technologies