Life and Reliability of EBS Diodes.
Abstract
The report describes a program to investigate the life and reliability of two types of electron-beam-semiconductor (EBS) diodes with the objective of demonstrating a 2500 hour life. One is large (approximately 1 cm diameter) and is suitable for high average power, low frequency amplifiers. The other is small (0.20 inch diameter) and can provide amplification up to 4.6 GHz. These diodes represent the extremes of the largest and smallest EBS diodes reported in the industry.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1974
- Accession Number
- AD0781741
Entities
People
- G. Demars
- J. Osepchuk
- Jamesina Simpson
- R. Bierig
Organizations
- RTX