Polarized Radiance. Volume III: Wavelength Dependence of Polarized Bidirectional Reflectance

Abstract

Volume III of this report provides the Ballistic Research Laboratories with a method for extracting information from a limited set of directional and bidirectional reflectance measurements so as to provide a wavelength-corrected input to the volume component of the bidirectional reflectance model described in Volume I. It is shown that the surface component of the bidirectional reflectance has little wavelength dependence for the materials studied from 0.63 micrometer through 3.39 micrometers. Data resulting from extensive measurements performed at 0.63 micrometer, 1.06 micrometers, and 3.39 micrometers and 10.6 micrometers under this contract are included and are used for the model validation which is also described. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
May 01, 1974
Accession Number
AD0782179

Entities

People

  • J. R. Maxwell
  • S. Weiner

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Abstracts
  • Advanced Materials
  • Contracts
  • Directional
  • Engineered Materials
  • Extraction
  • Geometry
  • Materials
  • Measurement
  • Measuring Instruments
  • Michigan
  • Micrometers
  • Optics
  • Reflectance
  • Spectrometers
  • Target Signatures
  • Validation

Fields of Study

  • Physics

Readers

  • Aerospace Test and Evaluation
  • Spectroscopy.