Study of Film Structure on a Commutator Formed by Brushes of Niobium-Diselenide-Graphite Composition,

Abstract

Methods of electron microscopy and microdiffraction are used to study a film of polish formed on a short-circuited M-1 copper commutator by brushes of niobium-diselenide-graphite composition. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 24, 1974
Accession Number
AD0782553

Entities

People

  • A. G. Duksina
  • E. B. Granovskii
  • V. L. Kalikhman
  • V. S. Titov

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Commutators
  • Electron Microscopy
  • Electrons
  • Graphitic Materials
  • Microscopy
  • Optical Analysis

Readers

  • Aerospace logistics and air mobility.
  • Electrical Engineering
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene