Electron Beam Semiconductor High Current Video Pulser.

Abstract

Ten EBS high current pulse amplifiers were fabricated, tested, and delivered to ECOM for life testing. The diodes used in these devices had an active area of 0.35 sq cm and were fabricated with an integral gold beam shield over the junction boundry to prevent diode reverse breakdown degradation due to beam illumination. The diodes were mounted on BeO substrates in order to be able to x-ray and evaluate the diode to substrate bond. Each of the devices was tested at approximately 40 A peak output into a 1 ohm load with a pulse risetime of 3 nanoseconds. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1974
Accession Number
AD0783435

Entities

People

  • Bruce W. Bell
  • Richard I. Knight

Organizations

  • Watkins-Johnson Company

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplifiers
  • Compound Semiconductors
  • Degradation
  • Electron Beams
  • Electronics
  • Electrons
  • Illumination
  • Integrals
  • Nanosecond Time
  • Pulse Amplifiers
  • Semiconductors
  • Solid State Electronics
  • Substrates
  • X Rays

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Electronics Engineering
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics