Evaluation of the Thermal Characteristics of the AN/WQC-2 Final Amplifier,

Abstract

An investigation was made of the thermal breakdown of eight AN/WQC-2 final amplifier transistors. After extensive investigation, it was found that the AN/WQC-2 system is safeguarded against final amplifier transistor failure due to overheating by a thermal interlock switch (3A4S1) mounted, essentially, on one of the final amplifier transistors (3A4Q17). In the event of a blower (3A4B1) failure the final amplifier would be protected, unless, either final amplifier transistor, 3A4Q17, or thermal interlock 3A4S1, was inoperative, then the thermal protection circuit would be defeated and thermal breakdowns imminent. Another possible final amplifier failure mode is direct overloading of the amplifier by too great of an Auxiliary 2 mode drive level, which would always lead to transistor failures. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1974
Accession Number
AD0783953

Entities

People

  • Jack R. Penrod

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Amplifiers
  • Electronic Amplifier
  • Electronic Equipment
  • Electronics
  • Failure Mode And Effect Analysis
  • Semiconductor Devices
  • Solid State Electronics
  • Test And Evaluation
  • Transistors

Fields of Study

  • Engineering
  • Physics

Readers

  • Electrical Engineering
  • Structural Health Monitoring of Composite Structures.
  • Systems Analysis and Design