Dynamic Analysis of MNOS Memory Devices.
Abstract
The study determines and demonstrates the feasibility of using the Macrodata MD-104 Test System for analysis of MNOS memory devices. The MD-104 Test System is a high-speed automatic unit designed to test semiconductor memories. The processor of this system regards the device under test as a logical black box, and the conditions that are particular to the device being tested are established on an interface board called a 'personality card'. A personality board was designed for the National Cash Register 1105 Electrically Alterable Read Only Memory. The NCR 1105 employs MNOS memory transistors in the memory array. The MD-104 Test System was used with the personality board to test the D.C. and A.C. operating characteristics of the NCR 1105 memory. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1974
- Accession Number
- AD0785126
Entities
People
- Jerry L. Showers
Organizations
- Air Force Institute of Technology