Rework of Linear Integrated Circuits.
Abstract
A-C probe techniques for screens and controls were evaluated to ensure radiation hardness of integrated circuits (ICs). A dielectrically isolated, photocurrent compensated linear IC was the test vehicle. A special metal pattern was used to isolate and provide probe pad leads for each active device on the IC. Air Force Weapons Laboratory personnel then probed the devices to determine the parameters that might indicate neutron hardness assurance. After the probing, the metal pattern was removed from a number of the devices which were then processed normally with NiCr, metal, and quartz overcoat. Possible damage to the silicon transistors caused by the special or the normal processes was evaluated by photographing a number of the bars and some slices from the devices. A unique procedure was used to label the separate bars so that their physical location on the slice could be determined after dicing. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1974
- Accession Number
- AD0786024
Entities
People
- James A. Lipman
Organizations
- Texas Instruments