Measurement of the Rate of Dissociative Attachment of Electrons to Fluorine in a Flowing Afterglow System.
Abstract
The dissociative attachment of low energy electrons to fluorine is a potential source of fluorine atoms in electrically initiated hydrogen-fluorine chemical laser systems. The ARL flowing afterglow system was developed to measure the rate of this reaction. Electrons are produced in a microwave discharge and react with fluorine, and the resulting negative ions are sampled through an orifice at the end of a reaction channel. Two other reactions were also studied in the process of developing the experimental technique: the charge transfer reaction between diatomic negative oxygen ion and sulfur hexafluoride and electron attachment to sulfur hexafluoride. (Modified author abstract)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1974
- Accession Number
- AD0786026
Entities
People
- Gary D. Sides
- Thomas O. Tiernan
Organizations
- Air Force Research Laboratory