Electronic Device Modeling.

Abstract

The integral charge control model of the bipolar junction transistor is reviewed, and the software which has been developed for estimating the model parameters from device measurements is discussed. An example of parameter estimation is given, and default parameter values listed. The SIGNCAP I input structure for both the charge control model and the field effect transistor model are given. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1974
Accession Number
AD0786422

Entities

People

  • L. Ehrman

Tags

DTIC Thesaurus Topics

  • Active Electronic Components
  • Bipolar Junction Transistors
  • Electronic Components
  • Electronic Equipment
  • Electronics
  • Field Effect Transistors
  • Integrals
  • Measurement
  • Transistors

Readers

  • Adaptive Control and Estimation with Uncertainty in Dynamic Systems.
  • Computer Science.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics