Characterization of Aluminum Adherend Surfaces.

Abstract

The purpose of this program was to characterize aluminum alloy adherends under accepted standard pretreatments, leading to an understanding of the behavior of the adherends under different chemical pretreatments and to possible future developments. Tech-niques such as scanning electron microscopy (SEM), energy disper- sive (ED) x-ray microanalysis, transmission electron microscopy (TEM) and selected area electron microscopy (SAD), reflection high energy electron diffraction (RHEED), auger electron spectro-scopy (AES), profilometry, and taper sectioning were utilized in the characterization. (AH-PL)

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1974
Accession Number
AD0786597

Entities

People

  • Amitav Pattnaik
  • John D. Meakin

Organizations

  • Franklin Institute

Tags

DTIC Thesaurus Topics

  • Aluminum
  • Aluminum Alloys
  • Auger Electrons
  • Diffraction
  • Electron Diffraction
  • Electron Microscopy
  • Electrons
  • Energy
  • High Energy
  • Microscopy
  • Scanning Electron Microscopy
  • Transmission Electron Microscopy
  • X Rays

Fields of Study

  • Materials science

Readers

  • Structural Health Monitoring of Composite Structures.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene