Production Engineering Measure for Microwave Transistors using Proton Enhanced Diffusion Technology.

Abstract

During the period covered by the report, continued improvements in Proton-Enhanced Diffusion (PED) processing were realized including a method for delineating the full base profile. The thermal resistance tests were completed with measurements made on a thermal microscanner. Results showed that the new thermal resistance test set gave accurate results and that PED does not affect thermal resistance. The second set of engineering samples was completed and delivered. Average noise figure was better than specification on both types shipped. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1974
Accession Number
AD0786779

Entities

People

  • Harry F. Cooke

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Diffusion
  • Engineering
  • Measurement
  • Microwaves
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Resistance
  • Specifications
  • Test Sets
  • Thermal Resistance

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Electronics Engineering
  • Systems Analysis and Design