Noise in the rf SQUID.

Abstract

The paper presents the results of an extensive study of the sensitivity limiting noise sources in rf-biased SQUID flux detectors. The investigation included both experiments with point contact and thin film SQUIDs and digital computer simulations. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1974
Accession Number
AD0787010

Entities

People

  • L. D. Jackel
  • R. A. Buhrman

Organizations

  • Cornell University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Computer Simulations
  • Computers
  • Control Simulators
  • Detectors
  • Digital Computers
  • Films
  • Sensitivity
  • Simulations
  • Simulators
  • Thin Films

Fields of Study

  • Physics

Readers

  • Acoustics.
  • Control Systems Engineering.
  • Superconducting Magnet Technology