Neutron Radiation Responses of Motorola MCE 54H79 Dual Type-D Flip-Flops,

Abstract

The high-power logic circuits (RSN54H00 series) has been quoted to function within nominal data sheet specifications at a neutron fluence of 5 x 10 to the 14th power n/sq cm (E > 10 keV). To determine the degradation beyond this point and how it would restrict circuit performance, two Motorola 54H79 Dual-D Flip-Flop samples were tested to a total fluence of 1.9 x 10 to the 15th power n/sq cm (E > 10 keV). The tests were performed at the the White Sands Missile Range Fast-Burst Reactor (WSMRFBR). The report presents the results of this test. The 54H79 can be considered representative for the whole 54H00 family.

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1971
Accession Number
AD0787105

Entities

People

  • J. K. Notthoff

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Circuits
  • Degradation
  • Logic
  • Logic Gates
  • Radiation
  • Specifications

Fields of Study

  • Physics

Readers

  • Computer Engineering
  • Nuclear and Radiation Engineering.
  • Software Engineering