Transient Upset Toleration as an EMP Hardening Technique.
Abstract
Both transient circuit upset and permanent component damage can produce serious malfunctions in modern electronics equipment. Although the issue is not yet clear, it may be possible to design and select components which have a much higher threshold to permanent damage than to transient upset. If this proves to be possible, then a degree of electromagnetic pulse (EMP) hardness would be achieved through designing systems to be completely insensitive to the effects of transient circuit upset. In the paper, the characteristics of the developed techniques for tolerating transient upset are described, various overall system design approaches are discussed, and the relation of specific upset toleration techniques to the system design approaches are illustrated. (Modified author abstract)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 05, 1974
- Accession Number
- AD0787620
Entities
People
- J. B. Houston
- W. R. Graham