Microstructural Observations on a Commercial Glassy Carbon,

Abstract

Ion sputtering has been used to thin a commercial glassy carbon for transmission electron microscopy. This thinning technique produces much larger thin regions than fragmentation which has previously been employed to produce specimens of glassy carbon for transmission electron microscopy and allows examination of the microstructure on a much broader scale. The glassy carbons which were examined were heat treated to 1800C. Specimens from several different lots were first thinned by mechanical polishing to a thickness of about 0.001 in. and then were further thinned by bombardment with 6 KeV argon ions until perforation. Examination of the thin regions was carried out in a Phillips EM300 transmission electron microscope at an accelerating voltage of 100 KV. Only at high magnifications could structure be resolved in the major portions of the foils. Ribbons spheroids and inclusions are described.

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1974
Accession Number
AD0787680

Entities

People

  • J. L. Kaae

Tags

DTIC Thesaurus Topics

  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Fragmentation
  • Inclusions
  • Magnification
  • Microscopes
  • Microscopy
  • Microstructure
  • Observation
  • Optical Analysis
  • Perforation
  • Polishing
  • Sputtering
  • Transmission Electron Microscopy

Fields of Study

  • Physics

Readers

  • Molecular Photonics/Laser Physics
  • Nanofabrication and Microfabrication.
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene