VACUUM MEASUREMENTS BY TIME-OF-FLIGHT MASS SPECTROMETRY

Abstract

Procedures are discussed for using mass spectrometers to make absolute partial pressure measurements of complicated residual gas mixtures in high vacuum systems. The details of the matrix inversion technique and an interaction procedure for calculating partial pressures from mass spectrometer data are presented. Performance of a Bendix Model 17-210V time-of-flight mass spectrometer and calibration data obtained are given. These data indicate that short-term instrument stability cannot be assumed for mass spectrometers which use electron multipliers for ion detection, and that instrument linearity can be assumed only under certain operating conditions. The data show that frequent, in-place, mass spectrometer calibrations are necessary. The matrix inversion technique and the iteration procedure were evaluated experimentally by reducing the 17-210V spectrum of a 12-component mixture of common residual gases whose partial pressures were known. The experimental results indicate that the iteration technique is the simplest to apply, and that it produces more accurate partial pressure solutions. It is concluded that accuracies of plus or minus 15 percent in partial pressure measurements are obtainable. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1966
Accession Number
AD0800436

Entities

People

  • A. J. Mathews
  • F. G. Sherrell

Organizations

  • Arnold Engineering Development Complex

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Abstracts
  • Accuracy
  • Alkenes
  • Calibration
  • Data Reduction
  • Dielectric Gases
  • Electron Multipliers
  • Electrons
  • Mass Spectra
  • Mass Spectrometers
  • Mass Spectrometry
  • Measurement
  • Partial Pressure
  • Pressure Measurement
  • Spectra
  • Spectrometers
  • Spectrometry

Readers

  • Aerospace Test and Evaluation
  • Combustion science or combustion engineering.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics