RESEARCH AND DEVELOPMENT PROGRAM INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS.

Abstract

It appears that markedly non-ohmic current-voltage releationships for C67 MONOLYTHIC capacitors indicate inferior life test capability because of Schottky emission as surmised from the close fit of the data to Dushman-Richardson-Schottky equation. On the basis of the 1200-piece life test matrix, it appears that short-life MONOLYTHIC capacitors can be identified by a voltage screening procedure. Data on a preproduction sampling of 0.033 micro f C67 Case Size I MONOLYTHIC capacitors containing 1.0 mil dielectrics are presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 31, 1966
Accession Number
AD0802274

Entities

People

  • H. F. Phillips
  • T. I. Prokopowicz

Organizations

  • Sprague Electric

Tags

DTIC Thesaurus Topics

  • Capacitors
  • Ceramic Capacitors
  • Dielectrics
  • Electronic Components
  • Electronic Equipment
  • Emission
  • Equations
  • Life Expectancy (Service Life)
  • Life Tests
  • Reliability
  • Sampling

Readers

  • Electrical Engineering
  • Regression Analysis.
  • Software Engineering