ACCELERATED RELIABILITY TESTING FOR NONELECTRONIC PARTS.

Abstract

This study was conducted to develop techniques to reduce test time, sample size and cost involved in the demonstration of the reliability of long lived nonelectronic parts. It was also the purpose of this study to validate the findings reported in RADC-TR-65-46, 'Accelerated Reliability Test Methods For Mechanical and Electromechanical Parts.' The vehicles used in this study were M8805/2-1 Subminiature Snap Action Switch of which a total of 940 from four different sources were tested at 28 different stress combinations and crystal can relays type MIL-R-5757/10 RY4NA3B3L01 of which a total of 1120 were procured and tested as were the switches. The most useful combination of over stress conditions has been determined for both switches and relays. It has also been determined statistically that time to first miss is an acceptable criteria of failure. This study provides validation of the mathematical models developed in the earlier study to transform the results of accelerated test to normal stress conditions. However, the model based on a constant ratio of hazard rates gives evidence of greatest validity. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1966
Accession Number
AD0803484

Entities

People

  • Robin Schäfer
  • W. Yurkowsky

Organizations

  • Hughes Aircraft Company

Tags

DTIC Thesaurus Topics

  • Demonstrations
  • Mathematical Models
  • Models
  • Reliability
  • Test Methods

Readers

  • Aerospace Test and Evaluation
  • Mathematics or Statistics
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems