EFFECT OF FILM RESISTANCE ON LOW-IMPEDANCE TUNNELING MEASUREMENTS.
Abstract
Measurements of low-impedance thin-film tunneling junctions at room temperature frequently yield inaccurate values for the tunneling resistance. In some cases the indicated resistance is negative. A theory is developed which shows that the finite resistance of the metal films can account for the observations. Results, given for the resistance of a tunneling junction as a function of temperature, show good agreement between theory and experiment. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1966
- Accession Number
- AD0804204
Entities
People
- F. L. Vernon Jr.
- R. J. Pedersen
Organizations
- The Aerospace Corporation