INVESTIGATIONS ON THE DIRECT CONVERSION OF NUCLEAR FISSION ENERGY TO ELECTRICAL ENERGY IN A PLASMA DIODE.

Abstract

Inpile microwave measurements of electron density in neon-argon and argon-cesium plasmas generated by fission fragments are compared with values of electron density predicted from a reaction kinetics theory. The main purpose of the comparison is to assess the validity of a theory designed to describe the dominant production and loss processes in noble gas-cesium thermionic converters over a wide range of conditions. For the neon-argon system the measured and predicted values were in good agreement. For the argon-cesium system the agreement between theory and experiment was less satisfactory. The highest measured electron density at full reactor power was approximately twice the computed value. Furthermore the electron density was found to be extremely dependent upon the temperature of the cavity walls. No satisfactory explanation has yet been found for this behavior. Favorable electron transport properties are expected to make the fission-fragment-generated argon-cesium plasma a good candidate for use in a nuclear thermionic converter. Theoretical transport properties are reported for this plasma when the major ion loss mechanism is ambipolar diffusion to the thermionic diode electrodes. The theoretical model is being expanded to include volume loss of the ions.

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Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1966
Accession Number
AD0806963

Entities

People

  • Charles B. Leffert
  • David B. Rees

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Boltzmann Equation
  • Chemical Kinetics
  • Computer Programs
  • Computers
  • Converters
  • Diffusion Coefficient
  • Electric Power
  • Electron Density
  • Electrons
  • Fission
  • Generators
  • Ionization
  • Measurement
  • Noble Gases
  • Thermionic Converters
  • Transport Properties
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Plasma Physics.

Technology Areas

  • Microelectronics