RADIATION EFFECTS ON ELECTRONIC PARTS AND MATERIALS.
Abstract
An analytical study was made for optimum methods and approaches to extract dielectric parameters to characterize capacitors which are subjected to intense short duration gamma ray pulses. These methods are being used to analyze data obtained from recent tests conducted at the advanced flash X-ray (AFXR) source at Physics International, San Leandro, California. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1967
- Accession Number
- AD0815272
Entities
People
- Frank A. Frankovsky
Organizations
- International Business Machines Corporation (Armonk, NY)