ACCELERATED TESTING OF HIGH RELIABILITY PARTS. VOLUME I.

Abstract

Long term tests to 30,000 hours were continued to provide correlation data for accelerated test results. A theory of life governing processes for electronic parts is given. The data are analyzed and presented to provide estimates of the life governing processes for each part type. A physics of failure study of mica, ceramic, porcelain, and glass capacitors was also performed and the results are included. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1967
Accession Number
AD0819853

Entities

People

  • Graeme Best
  • Tom Walsh

Organizations

  • General Electric

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Accelerated Testing
  • Capacitors
  • Electronic Components
  • Electronic Equipment
  • Glass Capacitors
  • High Reliability
  • Passive Electronic Components
  • Reliability

Readers

  • Business Analytics
  • Electrical Engineering
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics