ACCELERATED TESTING OF HIGH RELIABILITY PARTS. VOLUME 2

Abstract

Long term tests to 30,000 hours were continued to provide correlation data for accelerated test results. A theory of life governing processes for electronic parts is given. The data is analyzed and presented to provide estimates of the life governing processes for each part type. A physics of failure study of mica, ceramic, porcelain, and glass capacitors was also performed and the results are included.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1967
Accession Number
AD0819854

Entities

People

  • Graeme Best
  • Tom Walsh

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Accelerated Testing
  • Air Force
  • Capacitors
  • Contractors
  • Contracts
  • Electronic Components
  • Films
  • Glass Capacitors
  • High Reliability
  • Metal Films
  • Oxide Films
  • Reliability
  • Standards
  • Stress Tests
  • Test And Evaluation
  • Time

Readers

  • Structural Health Monitoring of Composite Structures.
  • Surface Coatings Technology.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics