RADIATION EFFECTS IN DIELECTRIC MATERIALS.

Abstract

Sapphire, fused quartz, and Pyrex thin-film substrate materials were irradiated with high-energy electrons from a linear accelerator to determine the transient electrical conductivity of the bulk substrate material and induced conductance between two adjacent electrodes on one side of the substrate. Methods were utilized to reduce the effects of replacement currents resulting from secondary emission. Sapphire was found to have at least an order of magnitude larger transient conductivity than that of fused quartz and Pyrex and exhibited persistent polarization effects. A silicon monoxide thin-film capacitor was also irradiated. The prompt conductivity coefficient, K (sub p), was 2.9 x 10 to the -6th power/(rad (Si)). No delayed conductivity was observed.

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1967
Accession Number
AD0820167

Entities

People

  • R. F. Overmyer

Organizations

  • General Dynamics

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Conductivity
  • Dielectrics
  • Electrical Conductivity
  • Films
  • High Energy
  • Linear Accelerators
  • Materials
  • Radiation
  • Radiation Effects
  • Secondary Emission
  • Silica Glass
  • Substrates
  • Thin Film Capacitors
  • Thin Films

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Semiconductor Device Technology
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene