INVESTIGATION OF HEAT REMOVAL FROM BOTH SIDES OF A TRANSISTOR CHIP EMPLOYING BUMP TECHNOLOGY.

Abstract

The following items were completed. (1) The design of four separate device structures; (2) The photolithographic masks were laid out and fabricated; (3) Nine lots of six wafers each were committed to processing with completed bumped dice from the initial lots available for mounting to headers; (4) Header design completed and delivery of 200 packages has been received; (5) A total of four dice have been successfully mounted on headers and are in evaluation. Problems have been encountered in device degradation, metallization, and in mounting the dice to headers. However, these problems are better understood now, and proper steps were taken to alleviate them. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1967
Accession Number
AD0824673

Entities

People

  • H. F. Rueffer
  • R. J. Belardi

Organizations

  • Hughes Aircraft Company

Tags

DTIC Thesaurus Topics

  • Active Electronic Components
  • Degradation
  • Electronic Components
  • Electronic Equipment
  • Electronics
  • Test And Evaluation
  • Transistors

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Microwave Engineering.
  • Software Engineering.