RESEARCH AND DEVELOPMENT PROGRAM INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS.
Abstract
Experiments and studies relating to the physics of failure of barium titanate capacitors are presented. Conductivity characteristics, ionic space-charge, and mechanism of dielectric breakdown are discussed. The 10,000-hour life test matrix of the 0.01 microfarad C67 subminiature capacitor has displayed tentative statistical relationships among life times, test voltages, test temperature, and test failure criteria. An evaluation of the failure criteria was conducted. A study was made into the differences among stability and magnitude criteria. This was made for life test non-failures predicted to failures by the burn-in failure criteria, and for life test failures predicted to be failures by the criteria. Assured life times were calculated and compared to actual results of the 10,000-hour life test. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1967
- Accession Number
- AD0824827
Entities
People
- A. Vaskas
- David A. Payne
- Harold F. Phillips
- Thomas I. Prokopowicz
Organizations
- Sprague Electric