RESONANT FREQUENCY VARIATION IN A RESONANT GATE TRANSISTOR AS A FUNCTION OF TEMPERATURE AND POLARIZATION VOLTAGE.

Abstract

A method of solving for the displacement and actual resonant frequency of a nonlinearly electrostatically loaded contilever beam is obtained. The method is written into a program for an IBM 1620 Computer. Output data from the program is used in another program written to characterize the resonant frequency of a Resonant Gate Transistor (RGT) versus polarization voltage and temperature. The coefficient of temperature for Young's Modulus for Gold is shown to vary at a rate dependent on the stress. An explicit expression is derived for the rate of polarization voltage compensation needed to maintain a constant frequency for the RGT with varying temperatures. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1967
Accession Number
AD0824902

Entities

People

  • Carroll Edward Deschaines

Organizations

  • Air Force Institute of Technology

Tags

DTIC Thesaurus Topics

  • Coefficients
  • Compensation
  • Computers
  • Displacement
  • Frequency
  • Modulus Of Elasticity
  • Polarization
  • Resonant Frequency
  • Transistors

Fields of Study

  • Engineering
  • Physics

Readers

  • Electrical Engineering
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Mechanical Engineering/Mechanics of Materials.