VACUUM EMISSION OF FIELD ENHANCED PHOTOELECTRONS FROM METAL-INSULATORS-METAL THIN FILM STRUCTURES.
Abstract
Al-Al2O3-Au thin film sandwiches were fabricated using electron beam evaporation and electrolytic anodization. Internal photoemission measurements yielded an insulator barrier height of 1.68 eV at the Al-Al2O3 interface and a dielectric constant of 3.74. External photoemission measurements in an ultra-high vacuum system yielded normal energy distribution curves which support the theory that electron-phonon scattering in the Al2O3 layer is the principal cause of attenuation in the hot electron stream. Contrary to assumed theory, analysis of the experimental distribution curves, for photon wavelengths of 4060 A and 5460 A, indicated that there is a direct proportion between attenuation and the initial energy of the photoexcited electrons. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1967
- Accession Number
- AD0825170
Entities
People
- Frank C. Vogel Jr.
- Ray M. Wallace
Organizations
- Air Force Institute of Technology