INCREASED CRYSTAL UNIT RESISTANCE AT OSCILLATOR NOISE LEVELS.
Abstract
Some quartz crystal resonators have shown a peculiar defect in which the equivalent resistive loss is greater at low power levels than at the normal test level. Since crystal oscillators begin oscillation essentially at the noise power level of the circuit, at oscillator turn-on, the crystal excitation is extremely low. Under these circumstances, the oscillator will not oscillate with a crystal that has a large resistance value at low power levels. A new test circuit is shown which has the capability of detecting even small increases in crystal resistance at the noise power of the Crystal Impedance Meter. Furthermore, this test arrangement is useful in quantitative measurements of this crystal characteristic. Data is presented on crystal processes for minimizing the increase in resistance of crystals operating at low power levels. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1967
- Accession Number
- AD0826146
Entities
People
- Marvin Bernstein
Organizations
- United States Army Communications-Electronics Command