FAILURE MECHANISMS IN SEMICONDUCTOR DIODES.

Abstract

The failure modes which have been identified are described in terms of the stress conditions required to induce them and the rates at which response may be observed. Typical values of the degraded parameter and the recovery characteristics are also discussed. All of the stresses utilized were highly accelerated, and the discussion is subdivided into the general classes of forward and reverse bias stresses. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1968
Accession Number
AD0827968

Entities

People

  • A. Fox
  • B. L. Bair
  • E. A. Herr
  • J. F. Schenck

Organizations

  • General Electric

Tags

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Diodes
  • Electronics
  • Failure Mode And Effect Analysis
  • Recovery
  • Semiconductor Diodes
  • Semiconductors
  • Solid State Electronics

Readers

  • Electronics Engineering
  • Structural Health Monitoring of Composite Structures.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics