PIEZOELECTRIC THIN FILM TRANSDUCERS.

Abstract

The methods by which CdS vapor deposition procedures and equipment have been improved are discussed. Techniques for multilayer transducers are described, together with microwave acoustic attenuation measurements on various dielectric and semiconductor materials. A method of modifying a standard evaporator for CdS film fabrication is given. Film thickness measurement procedures are reviewed and theoretical discussions are included to account for the attenuation measurements made. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1967
Accession Number
AD0829671

Entities

People

  • John De Klerk

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Acoustic Attenuation
  • Attenuation
  • Electronic Equipment
  • Films
  • Materials
  • Measurement
  • Semiconductors
  • Thin Films
  • Transducers
  • Vapor Deposition

Fields of Study

  • Materials science
  • Physics

Readers

  • Aerospace Test and Evaluation
  • Microwave Engineering.
  • Nanofabrication and Microfabrication.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems