ANELASTIC MEASUREMENTS OF POINT DEFECTS.

Abstract

Lattice defects and diffusion of atoms in several transition metal alloys have been examined using anelastic and magnetic measuring methods. In pure nickel phenomena associated with vacancies and divacancies have been observed. The thermodynamic properties of these defects have been determined. In nickel-carbon alloys an associated C-C pair has been identified and some of its motional properties determined. A similar C-C pair in the fcc phase of cobalt has been examined extensively. Not only have the parameters describing its diffusion been deduced, but also the probable symmetry axis, (100), has been determined. The tumbling of Ti-Ti substitutional pairs in dilute concentration in cobalt has also been observed. Detailed analysis of the results leads to the conclusion that the pairs responsible for the relaxation occupy next nearest neighbor lattice positions in the crystal. Both the motional energy and the binding energy of the pairs have been determined. Finally, the precipitation out of solid solution of N in deformed Nb has been followed by internal friction techniques. These measurements have been correlated with changes in hardness and yield strength during precipitation. The system shows unusual strain aging effects which will require careful electron microscopy for full understanding. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1968
Accession Number
AD0829681

Entities

People

  • C. A. Wert
  • Howard K. Birnbaum

Organizations

  • University of Illinois Urbana–Champaign

Tags

DTIC Thesaurus Topics

  • Alloys
  • Carbon Alloys
  • Crystal Lattices
  • Crystal Structure
  • Diffusion
  • Electron Microscopy
  • Friction
  • Internal Friction
  • Measurement
  • Microscopy
  • Point Defects
  • Precipitation
  • Solid Solutions
  • Thermodynamic Properties
  • Transition Metals
  • Yield Strength

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene