DEVELOPMENT OF A BURIED-GATE POWER FIELD-EFFECT TRANSISTOR.
Abstract
Power MOSFETS were processed which meet some of the d-c design goals of the contract, namely drain current of three amps, BV sub DSS congruent to 60 V. These devices were operated at 40 watts d-c dissipation with 80C case temperature. Detailed operating surface temperature measurements indicate a stable thermal system. Switching times of about 30 ns at 2A were also measured. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1968
- Accession Number
- AD0834793
Entities
People
- W. C. Bruncke
Organizations
- Texas Instruments