RESEARCH AND DEVELOPMENT INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS

Abstract

The 20,000 - hour, voltage/temperature life test matrix, which involved the 0.01 microfarad C67 Case Size 1 MONOLYTHIC (trade name) capacitor, is discussed. Frequency histograms of all leakage current data and Weibull determinations of failure rates for some of the test conditions are included. In addition, the criteria which determined short-life capacitors during testing are presented, as well as a comparison of calculated assured life times with the times to actual life test failures. Finally, the schedule and conditions for a second voltage/temperature life test matrix using 0.033 microfarad C67 device are briefly summarized.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1968
Accession Number
AD0839624

Entities

People

  • A. R. Vaskas
  • T. I. Prokopowicz

Organizations

  • Sprague Electric

Tags

Communities of Interest

  • Human Systems

DTIC Thesaurus Topics

  • Abstracts
  • Barium Titanates
  • Capacitors
  • Ceramic Capacitors
  • Contractors
  • Contracts
  • Department Of Defense
  • Electronic Components
  • Electronics
  • Failure Mode And Effect Analysis
  • Life Tests
  • Long Life
  • Massachusetts
  • New York
  • Reliability
  • Security
  • United States

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Life Cycle Cost Analysis
  • Statistical inference.