ELECTRON PROBE MICROANALYSIS (LA MICRO-ANALYSE A L'AIDE DE LA SONDE ELECTRONIQUE),

Abstract

Electron probe microanalysis, whether it be carried out point by point or by scanning, has been used chiefly to solve metallurgical problems. Among the advantages of the methods, one should point out: localization of the analysis, rapid execution, and the fact that the method is strictly non-destructive. Among the drawbacks, one should call attention to the necessity of making numerous corrections. The perfecting of the dosage of an element in a specimen type may be rather long and only after this method has been perfected, will it prove to be very rapid (the dosage of an element at one point takes approximately one minute). This method therefore seems particularly adaptable to routine studies, such as, for example, control of cathodes, grids and filaments of radio and television. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1968
Accession Number
AD0839663

Entities

People

  • Guy Lartigau

Tags

DTIC Thesaurus Topics

  • Electron Probes
  • Electrons
  • Filaments
  • Microanalysis
  • Probes
  • Scanning

Readers

  • Geodesy
  • Small Business Innovation Research Program (SBIR) EDI Research and Innovation.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics