DATA COLLECTION FOR NONELECTRONIC RELIABILITY HANDBOOK (NEDCO I AND NEDCO II). VOLUME 1

Abstract

This study addressed itself to the location, collection, classification, organization and analysis of nonelectronic part reliability information into a form from which it can be integrated into a Nonelectronic Reliability Handbook. The collection phase resulted in 38,761 line entries of failure data on approximately 600 different nonelectronic part types. These data, organized in logical groups are presented in the appendix of this report. The Data Analysis took several forms. Failure information on the same and similar part types was combined to yield overall failure rates for each of several environmental applications. Conversion factors were calculated to reflect the effect of varying severity of environments on part life. Failure rate versus stress relationships were sought but the data collected were not complete enough to yield useful relationships. Most of the failure information collected contained total part operating time and the number of observed failures. Since it was established that the statistical methods applicable to the reliability of nonelectronic parts must differ from those used traditionally for electronic parts, prediction models applicable to nonelectronic parts were sought. Three models showing promise are investigated in the Data Analysis Section and are compared with field data collected during the study. In each case more verification is required but the models included appear to be useful contributions to the field of nonelectronic part reliability.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1968
Accession Number
AD0841106

Entities

People

  • William Yurkowsky

Organizations

  • Hughes Aircraft Company

Tags

Communities of Interest

  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Aircrafts
  • Algorithms
  • Computer Programs
  • Computer Simulations
  • Confidence Limits
  • Data Analysis
  • Databases
  • Electronic Components
  • Electronic Equipment
  • Engineering
  • Failure Mode And Effect Analysis
  • Life Tests
  • Quality Control
  • Reliability
  • Test And Evaluation
  • Test Methods
  • Transducers

Fields of Study

  • Engineering

Readers

  • Library and Information Science
  • Life Cycle Cost Analysis
  • Theoretical Analysis.

Technology Areas

  • Microelectronics