AN X-RAY METHOD FOR DETERMINATION OF DYSPROSIUM IN THIN FILMS.

Abstract

An X-ray fluorescence method for the quantitative determination of dysprosium in high temperature dielectric thin films has been developed. This method can detect dysprosium in as low an amount as a few micrograms. A statistical treatment of the data yielded an analytical expression for the quantity of dysprosium in micrograms as a function of the intensity of the dysprosium X-ray emission line above background. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 16, 1968
Accession Number
AD0841217

Entities

People

  • D. Lutz

Organizations

  • Naval Air Warfare Center Warminster

Tags

DTIC Thesaurus Topics

  • Dysprosium
  • Emission
  • Films
  • Fluorescence
  • High Temperature
  • Intensity
  • Thin Films
  • X Rays

Fields of Study

  • Physics

Readers

  • Human-Computer Interaction (HCI).
  • Regression Analysis.
  • Thin Film Deposition Science.