Nondestructive Measuring of Composition and Thickness Over Small Areas of Thin Coatings with the Aid of X-Ray Fluorescence,

Abstract

The report discusses the use of an X-ray fluorescence technique for determining thickness and composition of thin metal films.

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1962
Accession Number
AD0847364

Entities

People

  • Reinhardt Weyl

Organizations

  • General Dynamics

Tags

DTIC Thesaurus Topics

  • Films
  • Fluorescence
  • Germany
  • Metal Films
  • Thickness
  • West Germany
  • X Rays

Fields of Study

  • Physics

Readers

  • Thin Film Deposition Science.