Failure Mechanism Study of Gold-Doped Planar Diodes.

Abstract

The purpose of this investigation was to verify the basic failure mechanisms present in a gold-doped planar diode device so as to furnish a basis for process improvement and reliability prediction. Photoresponse mapping and MOS capacitance measurements were exploited to provide information on degraded diodes. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1969
Accession Number
AD0849861

Entities

People

  • Thomas J. Rossiter

Organizations

  • Rome Laboratory

Tags

DTIC Thesaurus Topics

  • Capacitance
  • Electrical Impedance
  • Electrical Properties
  • Electricity
  • Engineering
  • Failure Mode And Effect Analysis
  • Measurement
  • Reliability

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Software Engineering