Qualification Procedures for Integrated Devices (QUPID). Volume I. Studies, Evaluations and Verification Testing.
Abstract
The program objective was the generation of optimum qualification procedures for silicon monolithic microcircuits. The work included reviewing existing literature and specifications; contacting manufacturers and users of integrated devices to determine the normal procedures used for high-reliability qualification; identification of areas they considered deficient or too stringent; and performing evaluations necessary for determining effective screening techniques. Two qualification documents were generated, one for parts qualification and one for vendor qualification. Normalized cost estimates for large-and small-lot qualification were also developed. The two documents and the cost data were submitted to other members of the semiconductor industry for criticism and comment, some which led to changes in the documents. To verify the adequacy of the part qualification procedures, devices were tested according to the part qualification document and the results compared with those from devices from the same lots but screened according to normal in-process procedures. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1969
- Accession Number
- AD0854594
Entities
People
- Richard H. Soltau
- William M. Berger