Computer Aided Circuit Analysis as a Method of Predicting Circuit Response to Fast Rise Pulse,
Abstract
Transients can be introduced into electronics from a number of sources, and transients of the pulse type can be generated energy originating from nuclear detonations or lightning. These pulses will have a fast rise time and an amplitude that exceeds the normal operating voltages of semiconductor devices. In order to analyze the effect of these pulses on electronics, the Transient Radiation Effect on Electronics (TREE) circuit analysis codes were employed. The object of this paper is to compare predicted circuit responses with measured responses on three circuits in a controlled experiment. From this comparison a determination of the validity of the use of these codes was made. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 30, 1968
- Accession Number
- AD0854774
Entities
People
- Hugh W. Greene
- Victor W. Ruwe